Electronics Engineering (Height 130 mm)

Explore how thin films deform, crack, and evolve on a microscopic level with this comprehensive guide to stress mechanics, defect dynamics, and surface morphology in advanced materials.
Springer-Verlag New York Inc. (9781461435228 / 118 black & white illustrations, 660 col)
(9781449310561 / 9781449310561) - Dimensions: 14.7cm x 21.6cm - ISBN: 9781449310561 - Publish date: 02/03/2012

Filters

🤖 Hello! I’m your virtual assistant. I can help you find products, compare prices and answer questions about your orders. Where should we start?
Chatbot service provided thanks to Gemini 3 / OpenAI using Comparor’s database. The AI may make mistakes — always verify the information.
Comparor AI BETA
Online
Restart the conversation?